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TEST SYSTEMS
51
BiPolar test systems 4.5 kV
Thyristor and diode static / dynamic X X GTO and diode static X X GTO and diode dynamic X
IGBT test systems
IGBT and diode dies static X X IGBT and diode substrates static / dynamic X X IGBT and diode modules static X X IGBT and diode modules dynamic
Reliability test systems
• High temperature reverse bias • Intermittent operating life
• Surge current
XXXX XX
XX
X XXX
X XX
Auxiliary unit
• Clamping unit
• Capacitor discharge unit
• Pre-heating unit
• Programmable IGBT and thyristor gate units
• Data acquisition and parameter extraction units
Blocking voltage AC or DC
Gate characteristics
On-state, forward voltage Reverse recovery charge
Critical dV/dt Circuit-commutated turn-off time
Vcesat / Vpinch-off Turn-on / turn-off
