Page 117 - PCMI December 2017 Journal

Material Proper es Of High Performance Precision Str1ip1/S2t6ee/1l 7 Jonas Nilsson |R&D Mgr. Precision Strip | Sandvik Materials Technology | SE
Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
• Focused Ion Beam (FIB) integrated within a SEM.
- The ion beam is used to remove material with nano-precision
- Possible to visualize what is below the surface
- Thin foils for TEM
• Very useful for studies of thin coatings
Electron Back Scattered Diffraction (EBSD)
• 2 Cameras in operation
• Diffraction patterns from individual grains
• Lateral resolution, about 0.1 μm
• Structure and orientation of grains are determined pixel by pixel
• Examples of applications include: - Measurement of grain size
- Texture with lateral information
- Fraction & morphology of different phases (e g ferrite/austenite)
Issue 130 December 2017 PCMI Journal Page 116
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