Page 179 - PCMI Journal July 2018

Jonas Rosen | Mgr., Sandvik Stainless Service | Marie Vennström | PhD in
Chemistry |Sandvik Materials Technology | SE
Stainless Service, a New Opportunity to Access Sandvik Material Expertise
5/29/18
SEM - IMAGIN
• Standard technique for material characterization.
• Images give chemical or topographic contrast.
• Here is a cross section of a strip with a metallic coating that is 1,2 mm thick.
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ELECTRON BACK SCATTERED DIFFRACTION
• An additional detector on a SEM • Examples of applications:
- Grain size measurements
- Texture with lateral information
- Fraction and morphology of different phases
Technical specification:
• Diffraction patterns from individual grains
• Lateral resolution, about 0.1 μm
• Structure and orientation of grains are determined pixel by pixel
Issue 131
July 2018
PCMI Journal
178
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