Page 180 - PCMI Journal July 2018
P. 180
Jonas Rosen | Mgr., Sandvik Stainless Service | Marie Vennström | PhD in Chemistry |Sandvik Materials Technology | SE
Stainless Service, a New Opportunity to Access Sandvik Material Expertise
5/29/18
FOCUSED ION BEAM, FIB
• Focused Ion Beam (FIB) integrated within a SEM.
- The ion beam is used to remove material with high precision
- Produce thin foils for TEM
• Suitable for studying thin coatings and investigate
features close to the surface or located in a specific area like a grain boundary.
TRANSMISSION ELECTRON MICROSCOPY, TEM
• TEM techniques are mainly used for:
− Phase identification of small precipitates − Determine chemical composition
Issue 131
July 2018
PCMI Journal
179
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