Page 15 - Six Sigma Advanced Tools for Black Belts and Master Black Belts

JWBK119-FM
Preface
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In Part C, we start with a chapter reviewing goodness-of-fit tests for normality, and
then give a basic treatment of categorical data. These techniques are instrumental in
analyzing industrial data. A novel graphical approach in determining the confidence
interval for the process capability index, C pk , is then presented. This is followed by
an examination of the transformation of geometrically distributed variables. These
two chapters are based on material previously published in the journal Quality and
Reliability Engineering International. A case study to illustrate how to do subset selection
in multiple regression is given and could serve as an application guide.
Part D begins with a glossary list in design of experiment (DOE) and is based
on four previously published papers by the authors. These papers aim to illustrate
important concepts and methodology in DOE in a way that is appealing to Six Sigma
practitioners.
Finally, in Part E, some advanced charting techniques are presented. These include
the cumulative conformance count chart, cumulative sum (CUSUM) charts with head-
start features, and CUSUM charts for autocorrelated processes. Particular emphasis
is placed on the implementation of statistical control for autocorrelated processes
which are quite common in today’s industry with automatic data loggers. Notably, we
include a contributed paper by Dr Orlando Atienza that proposes a novel approach to
monitoring changes in mean, variance and autocorrelation structure simultaneously.
This book is a collection of concepts and selected tools that are important to the
mature application of the Six Sigma methodology. Most of them are motivated by
questions asked by students, trainees and colleagues over the last decade in the course
of our training and consulting activities in industry. Some of these have been presented
to graduate students to get their research work off the ground. We are thus indebted
to many people who have contributed in one way or another to the development
of the material, and it is not easy to mention every one of them. In particular, our
colleagues and students at the National University of Singapore and many Master
Black Belts, Black Belts, and Green Belts of Seagate Technology have been our sources
of inspiration. We would also like to thank Dr W. T. Cheong (now with Intel) and
Mr Tony Halim who have assisted in the preparation of the manuscript.

L. C. Tang
T. N. Goh
H. S. Yam
T. Yoap
Singapore, April 2006