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        74 August 31, 2006  2:55  Process Variations and Their Estimates
                                         Variation




                             Process Variation    Measurement Variation


                         within unit               within instrument
                         between units             between instruments
                         between lots              between calibrations
                         between operators         between operators

                         between machines
                                                   across time
                         between set-ups
                         across time
                                Figure 6.1 Sources of variation.



        how well these services, products and processes are meeting their requirements and
        expectations; in other words, how well they conform to standards. Distinguishing the
        sources of process variation is paramount because the appropriate measurements are
        different for each. Without this distinction, five-step problem-solving approach of the
        Six Sigma methodology -- define, measure, analyze, improve, and control (DMAIC)
        cannot be utilized effectively (the detailed and extended DMAIC approach can be
        found in the book by Harry and Schroeder). 1
          Many processes have more than one source of variation in them. In order to re-
        duce variation in processes, these multiple sources must be understood. As shown
        in Figure 6.1, process variation consists of within-unit variation, between-units vari-
        ation, between-lots variation, between-operators variation, between-machines varia-
        tion, between-set-ups variation, and, lastly, variation over time.
          For example, in the semiconductor industry, a batch process may operate on several
        wafers at a time. The defects found at different locations on a wafer are considered as
        a within-unit variation, as there are many other locations where the wafer is defect-
        free. On the other hand, one might detect the defect at one particular location of one
        wafer but not of another wafer in the same process batch; such variation is catego-
        rized as between-unit variation. The difference in defective rate between each lot is
        considered as between-lots variation. Similarly, the disparity between the products
        or services provided by different operators or machines is designated as between-
        operators variation, or between-machines variation, respectively. The difference in
        process yield for different set-ups can be treated as between-set-ups variation. Due to
        aging, the performance of the process will deteriorate, and this variation is unavoid-
        able over the lifetime of a process. In addition, the cumulative effect of many small,
        essentially unavoidable causes will lead to different process outcomes; these chance
        causes are an inherent part of the process.
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