Page 83 - RTH3BA Preview

INDEX BY CHAPTER

MOSFETs protected gate 275 DDS 556
N-channel JFET 271 digital multimeter - DMM 558
noise 261 digital phosphor oscilloscopes 532
NPN bipolar junction transistor 258 digital storage oscilloscope 532
over-volt protection 277 dip oscillator 552
pinch off 272 direct digital synthesis 556
PNP bipolar junction transistor 259 display controls, oscilloscope 537
point contact diode 261 DPO 532
reverse biased PN junction diode 250 DSO 532
Schottky diode 262 function generator 555
SCR internal construction 276 horizontal controls 539
shunt regulators 254 input coupling 538
silicon 244 math operations 539
silicon controlled rectifier 275 oscilloscope 530
simple light dimmer 276 power measurements 546
thermal runaway. 269 radio frequency probe 554
thyristor 277 real-time sampling with interpolation 536
transient voltage suppression on a reflectometer 551
telephone line 257 sampling methods 536
transistors 258 spectrum analyser 540
transistor configurations 264 spectrum analyser with tracking generator 542
triac 277 ssb measurements 544
unbiased pn junction diode 249 sweep function generator 557
varactor, varicap 254 time base selection 539
variation of varactor capacitance 255 a two tone test oscillator 545
voltage divider bias 268 two tone test signal on an oscilloscope 544
zener voltage regulator 253 vertical controls 538
VSWR meter 549
T VSWR meter (BRUENE BRIDGE) 551
Waveforms - time and frequency domain 541
Test equipment and measurements 528
Transformers 153
amplitude modulation - complex modulation..
a buzzer 153
(voice) 548
autotransformers 160
antenna impedance analyser 565
circuit symbol 155
cathode ray tube 528
copper loss 158
cathode ray oscilloscope 531
eddy currents 156
component testers 567
external induction loss 158
CRO DSP 534
Faraday’s law 154
CRT 528
hysteresis losses 158
CRT electron deflection 529
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