Page 16 - SENSE Newsletter Issue 2
P. 16
Invited Talk
Dr._Gargi Raina delivered an Invited talk entitled “Probing
Graphene interfaces using AFM Nanolithography & EFM” at the
Bruker AFM User’s Meet, organized by Forevision Instruments and
Bruker Nano Surfaces Division, in Bangalore on December 1-2,
2017. This Bruker AFM meet was organized to update Scanning
Probe Microscopy users about the latest inventions and technology
developments as well as deliberate on technical and application
oriented research in the field.
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