Page 289 - Industrial Tools Catalog (2)

Shape, contour and roughness measurements \ Roughness measuring instruments

DIAVITE Compact II roughness measuring device
mobile roughness measuring device with external feed unit
Application: ƒ Measurements in all directions, horizontal, vertical
Compact, mobile roughness measuring device for and overhead
standard roughness measurements in production
facilities and measuring rooms. Delivery:
Display device with feed unit, standard sensor SH
Execution: 5 μm/90°, adapter and connection cable for feed
ƒ Roughness parameters in line with DIN ISO, JIS, unit, power supply/charger, CD with DIASOFT Basic
ASME software, USB connection cable for PC, roughness
ƒ Standard probe SH with diamond probe tip 5 µm standard approx. Ra 3 µm, case
ƒ Ident. No. 100: Stylus instrument with feed unit Technical data: Ident. No. 100
VH for skid-type probe ƒ Surface roughness measuring range: 350 µm |
ƒ Ident. No. 110: Stylus instrument with feed unit 20 µm
VHF for skid-type probes and free tracers ƒ Min. scanning path: 0.5 mm
Advantage: ƒ Max. scanning length: 15 mm
ƒ Surface roughness resolution: 0.001 µm | 0.01 µm
ƒ Simple and intuitive operation, no training required ƒ Threshold wave length: 0.25 mm | 0.8 mm | 2.5
ƒ Safe measurement using permanently connected mm
cut-off filter with scanning path ƒ Measurement profile memory (number of profiles):
ƒ Feed unit can be integrated into device for wireless 15 PCS
measuring ƒ Data transmission type: USB
Ident. No. 110

Model Probe system
47000... DIAVITE Compact II VH Runner probe system Ident. No. 100
●
47000... DIAVITE Compact II VHF Runner probe system | Free probe Ident. No. 110
●
system
Prod. Gr. 445
MarSurf PS 10 roughness measuring device
Mobile roughness measuring device with removable feed unit

Application: ƒ Measurements in all directions: horizontal, vertical
compact, mobile roughness measuring device for and overhead
standard roughness measurements in production
facilities and measuring rooms. Technical data:
ƒ Surface roughness measuring range: 350 µm
Execution: ƒ Surface roughness scanning path: 1,5 mm | 4,8
ƒ stylus instrument with feed unit for skid-type probe mm | 15 mm
ƒ calibration standard integrated in feed unit ƒ Threshold wave length: 0.25 mm | 0.8 mm | 2.5
mm
ƒ Roughness parameters in line with DIN ISO, JIS ƒ Measurement profile memory (number of single
and ASME readings): 500000 PCS
ƒ inductive skid button with 2 µm diamond stylus tip ƒ Measurement profile memory (number of profiles):
Advantage: 3900 PCS
ƒ simple and intuitive operation, no training required ƒ Data transmission type: MarConnect
ƒ reliable measurement using automatic cut-off
selection (patented)

MarSurf PS
10 roughness 020
measuring 47100... Ident. No. ●
device
Measuring
stand for 600
Ident. No.
roughness 47100... Measuring Price/unit, € (792.00)
stand ST-D
measuring
devices
Measuring 47100... measuring Ident. No. 670
stand holder
stand mount for ST tripods ○
680
Ident. No.
Software 47100... Software Price/unit, € (323.00)
EXPLORER
Prod. Gr. 307

Source: Hahn+Kolb Werkzeuge GmbH
Technical data subject to change. www.iconridge.com 1089
Availability subject to country specific rules and regulations.