Page 290 - Industrial Tools Catalog (2)

Shape, contour and roughness measurements \ Roughness measuring instruments
MarSurf M 300C roughness measuring device
Mobile roughness measuring device with external feed unit for skid-type probe

Application: ƒ Measurements in all directions, horizontal, vertical
Mobile roughness measuring device for standard and overhead
roughness measurements in production facilities and ƒ Lock and/or password-protected device settings
measuring rooms. ƒ Up to 5 selectable individual measurement lengths
Execution: Technical data:
ƒ Stylus instrument with feed unit for skid-type ƒ Surface roughness measuring range: 350 µm | 180
probes µm | 90 µm
ƒ Calibration standard integrated into feed unit ƒ Surface roughness scanning path: 1.75 mm | 5.6
ƒ Roughness parameters in line with DIN ISO, JIS, mm | 17.5 mm
ASME and MOTIF ƒ Surface roughness resolution: 0.032 µm | 0.016
ƒ Standard tracer PHT 6-350 with diamond probe µm | 0.008 µm
tip 2 µm ƒ Threshold wave length: 0.25 mm | 0.8 mm | 2.5
ƒ Thermal printer with high print quality mm
ƒ Measurement profile memory (number of single
Advantage: readings): 40000 PCS
ƒ Bluetooth connection for wireless data transfer ƒ Measurement profile memory (number of profiles):
between feed unit and evaluation unit 30 PCS
ƒ Simple calibration using integrated calibration ƒ Data transmission type: RS232C/USB
standard
Model Probe system
Roughness Runner probe 200
47100... measuring device MarSurf M 300 C Ident. No.
MAHR M 300 C system ○
Prod. Gr. 307
DIAVITE DH-8 roughness measuring device
With external feed unit: VH for skid-type probes or VHF for skid-type and free tracers
Application: ƒ Evaluation software DIASOFT Basic with individual
Compact, mobile roughness measuring device for log generation
standard roughness measurements in production
facilities and measuring rooms. Delivery:
Display device with feed unit, standard sensor SH
Execution: 5 μm/90°, connection cable for feed unit, power
ƒ External calibration standard Ra 3.0 µm supply/charger, CD with DIASOFT Basic software,
ƒ Roughness parameters in line with DIN ISO, JIS, USB connection cable for PC, roughness standard
approx. Ra 3 µm, case
ASME
ƒ Standard probe SH with diamond probe tip 5 µm Technical data:
ƒ Thermal printer with high print quality ƒ Surface roughness measuring range: 350 µm |
ƒ Ident. No. 706: Stylus instrument with feed unit 20 µm
VH for skid-type probe ƒ Min. scanning path: 0.5 mm
ƒ Ident. No. 716: Stylus instrument with feed unit ƒ Max. scanning length: 15 mm
VHF for skid-type probes and free tracers ƒ Surface roughness resolution: 0.001 µm | 0.01 µm
ƒ Threshold wave length: 0.08 mm | 0.25 mm | 0.8
Advantage: mm | 2.5 mm
ƒ Total of seven scanners can be calibrated ƒ Measurement profile memory (number of profiles):
ƒ Freely-selectable scanning path and cut-off filter 50 PCS
ƒ Large measured value memory for 50 measure- ƒ Data transmission type: USB
ment profiles
Model Probe system
44805... DIAVITE DH-8 VH Runner probe system Ident. No. 706
●
44805... DIAVITE DH-8 VHF Runner probe system Ident. No. 716
○
| Free probe system
Prod. Gr. 445

Source: Hahn+Kolb Werkzeuge GmbH
1090 Technical data subject to change. www.iconridge.com
Availability subject to country specific rules and regulations.