Page 146 - Testing Electronic Components

Testing Silicon Controlled Rectifier

Testing SCR (silicon controlled rectifier) can be done by using an
analogue multi meter or specialize tester (such as the Peak electronic atlas
component analyzer-http://www.peakelec.co.uk) designed to check
semiconductor devices easily. SCR can be found in many electronic
circuits. Part numbers such as the FOR3G and MCR 100-6 were very
common used in computer monitor.

Some called SCR as thyristor but in actual fact the word thyristor should
not be associated exclusively with the silicon controlled rectifier. It is in
fact a general name given to all four layer PNPN devices including the
commonly used SCR. The diac, the Triac, and the SCS are the other
popular devices belonging to the family of thyristors.

SCR consists of three pin of Gate (G), Anode (A) and Cathode (C). In
order to identify the pin out, one must find it from semiconductor data

146