Page 221 - Fiber Optic Communications Fund
P. 221

202                                                               Fiber Optic Communications


              Note that a fast transit time implies a thin detector active region, while low capacitance and high responsivity
            require a thicker active region. Thus, there are trade-offs between fast transit times and low capacitance for
            high-speed response, high quantum efficiency, low dark current, and good coupling efficiency when used in a
            fiber system. For example, a fast transit time requires a thin detector photoactive region, while low capacitance
            and high responsivity (or quantum efficiency) require a thick active region. It is very generally favorable to
            design the absorption region to be larger than the penetration depth using expression (5.22).
              Also, a smaller detector active area leads to lower dark current and smaller junction capacitance, but may
            be inefficient for detector coupling to the fiber when used in fiber-coupled systems. Therefore, building on
            the above examples, a silicon-based sensor that is optimized for 680-nm detection should be designed to have
            the thickness of the semiconductor within 4.5–9 μm.


            5.2.6   Linearity

            Typically, reverse-biased photodetectors are highly linear devices (Fig. 5.9). Detector linearity means that the
            output electrical current (photocurrent) of the photodiode is linearly proportional to the input optical power.
            Reverse-biased photodetectors remain linear over an extended range (six decades or more) of photocurrent
            before saturation occurs. Output saturation occurs at input optical power levels typically greater than 1 mW.
            Because fiber-optic communication systems operate at low optical power levels, detector saturation is gener-
            ally not a problem.




            5.3 Common Types of Photodetectors
            As mentioned in Section 5.1, semiconductor photodetectors can be broadly classified into those without inter-
            nal gain and those with internal gain. In the first category are pn photodiodes, pin photodetectors, Schottky
            barrier photodetectors, and MSM-PDs. In the second category are photoconductors, phototransistors, and
            APDs. These second types of photodetector are used to improve the overall sensitivity of the front-end pho-
            toreceiver.


                                  I PC (A)


                                                                Saturation



                                         Dynamic
                                           range   Ideal
                                                  response
                                               Total noise



                                        P n               P n          P I (dBm)

            Figure 5.9  Response characteristics of a typical photodetector. Important features of the response characteristics are
            indicated in the figure.
   216   217   218   219   220   221   222   223   224   225   226