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OTE/SPH
 OTE/SPH
                         3:8
          August 31, 2006
                              Char Count= 0
 JWBK119-23
        356            Statistical Process Control for Autocorrelated Processes
             Zt                               Yt
              6                                6
                A                                B
              4                                4
              2                                2
              0                                0
             −2                               −2
             −4                               −4
               0    20   40    60    80   100   0    20    40   60    80   100
                           TIME (t)                         TIME (t)

             Yt                                Yt
              6                                6
                C                                D
              4                                4
              2                                2
              0                                0
             −2                               −2
             −4                               −4
               0    20   40    60    80   100   0    20    40   60    80   100
                           TIME (t)                         TIME (t)

        Figure 23.1 (A) A simulated AR(1) series with φ = 0.5. (B) The simulated AR(1) series with
        AO at t = 51. (C) The simulated AR(1) series with IO at t = 51. (D) The simulated AR(1) series
        with LS at t = 51.



        ω 0 is a constant denoting the initial impact of the disturbance. When ω(B)/δ(B) =
        1, the disturbance is an additive outlier. An AO affects the level of the observed
        time series only at time t = d. A common cause of AOs is data recording error. In
        a discrete manufacturing process, an AO can occur when there are mixed units in a
        large lot of raw materials. When ω(B)/δ(B) = θ(B)/φ(B), equation (23.3) represents an
        innovational outlier. An IO affects the level of Y t at t = d. After t = d, this effect fades
        exponentially. An IO is most likely caused by a contaminant in a continuous chemical
        process. During preventative maintenance in a chemical factory, for example, if an
        existing spare part (e.g. pipe or other connector) is replaced by a contaminated unit,
        the characteristics of the chemical being processed will be grossly affected at time t = d
        but thereafter the effect of the contaminant will fade. When ω(B)/δ(B) = 1/(1 − B),
        the disturbance represented by equation (23.3) is a level shift. An LS shifts up or down
        the level of Y t starting at t = d. This shift persists for t > d. An LS is mainly caused
        by a change in material quality or process settings. Figure 23.1 illustrates the effect of
        the three types of outlier on an AR(1) process. In what follows, we use ω AO , ω IO , and
        ω LS to distinguish whether ω 0 is associated with an AO, IO or LS, respectively.
          From equations (23.2) and (23.3) we obtain the following expression:
          φ(B)     φ(B)ω(B) (d)
               Y t =        ξ t  ω 0 + ε t .
          θ(B)     θ(B)δ(B)
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