Page 366 - Six Sigma Advanced Tools for Black Belts and Master Black Belts
P. 366

OTE/SPH
 OTE/SPH
                              Char Count= 0
          August 31, 2006
                         3:7
 JWBK119-22
                                       Conclusion                            351
               MH-statistic
               25
               20
                   UCL=16.32
               15


               10
                5


                0
                 0         100       200       300        400       500
                                         Time (t)
                     Figure 22.6 The MH chart for the series in Figure 22.5.



        At t = 200, the MH-statistic is therefore given by

                                            1.00 −0.90 0.00  0.00  0.00  −0.577
                                         ⎡                           ⎤ ⎡       ⎤
                                         ⎢ −0.90 1.81 −0.90 0.00  0.00 ⎥ ⎢ 1.934 ⎥
                                         ⎢                           ⎥ ⎢       ⎥
        MH = [ −0.577 1.934 1.968 1.234 1.224 ] ⎢ 0.00 −0.90 1.81 −0.90 0.00 ⎥ ⎢ 1.968 ⎥
                                            0.00  0.00 −0.90 1.81 −0.90  1.234
                                         ⎣                           ⎦ ⎣       ⎦
                                            0.00  0.00  0.00 −0.90 1.00  1.224
            = 6.437
      Theabovequantitybecaneasilyobtainedusingstandardspreadsheetsoftwaresuchas
      Excel or Lotus1-2-3. The next MH-statistic, which is based on the vector of observations

      x * 201  = (x 197 , x 198 ,..., x 201 ) , can be computed in the same manner. The MH statistics
      for t = 196 to t = 205 are given in Table 22.1. The entire control chart for the series
      in Figure 22.5 is shown in Figure 22.6. Clearly, the proposed control chart effectively
      detected the simulated process excursions.



                                22.5  CONCLUSION

      Most modern industrial processes produce measurements that are autocorrelated.
      To effectively detect the presence of process excursions caused by external sources
      of variation, we must simultaneously monitor changes in the MVAS of the process
      measurements. One way to monitor an autocorrelated process is to maintain three
      control charts (one each for detecting change in the mean, variance, and autocorrela-
      tion structure of the series). Another alternative is to devise a monitoring procedure
      that can simultaneously detect changes in the MVAS. Using the characteristics of a
      stationary Gaussian ARMA process, we develop a control-charting scheme based on
      the H statistic (22.1). In comparison with other Shewhart schemes for monitoring
      autocorrelated processes, the proposed moving H chart is found to be effective in
      simultaneously detecting shifts in the MVAS of a series.
   361   362   363   364   365   366   367   368   369   370   371