Page 212 - Maxwell House
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192                                                                Chapter 4


                                 
        Evidently, the factor   =  characterizes  the  velocity of the  wavefront and energy
                           1
                                
        propagation that is equal to    = √ �30 �  ⁄ . Typically,  in  highly conductive
        metals 30  ≫ 1, the EM wave moves extremely slow and thus loses a lot of its energy even
                 ⁄
        on the short distance. It is ordinarily practice to characterize the energy lost by the value called
                                                                             −1  or
                                                                   − 2  
        skin-depth and define it as the path    through the exponential factor   = 
                                              1       1
                               = 1  ≅ �  ≅  � ≅ 503�  [m]  (4.89)
                                   �
                                     2
                                              2
                                          120   35    
        Here  in [m], frequency in [Hz] and  in [S/m]. Figure 4.4.2  illustrate the skin-depth vs.
                                                            8
                                                    frequency for several metals and alloys
                        50 Hz                       up to 1MHz.
                                                    At microwave  frequencies (typically
                                                    above 300 MHz) the skin-depth shrinks
                                                    to a fraction of mm, typically measured
                                                    in  µm  (see table  on  your left) and
                                                    becomes   comparable  to  surface
                                                    roughness  meaning  that  the  metal
                                                    surface  slightly deviates  from  the
                                                    perfectly flat as it can be seen in Figure
                                                         9
                                                    4.4.3a .  The  roughness  is  a  random
                                                    quantity defying generally by  the
                                                    manufacturing process and it can be
                                                    specified in terms of the  RMS (root
              Figure 4.4.2 Skin-depth vs. frequency   mean square)  peak-to-valley height  of
                                                    the surface unevenness. The exemplary
        roughness profile tracing small changes in surface height is sketched in Figure 4.4.3b. The RMS
        Height (RMSH) is defined as










                                        a)                                  b)
         Figure 4.4.3 a) 3D microprofile surface of metal strip, b) Roughness profile measurement for
                                       RMSH definition


                                             2  2  2   2
                                            ℎ +ℎ +ℎ +⋯+ℎ 
                                   = �  1  2  3                (4.90)
                                                 


        8  Public Domain Image, source: https://en.wikipedia.org/wiki/Skin_effect
        9  Public Domain Image, source:  http://www.novacam.com/products/profilometers/
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