Page 8 - PR 2014 2016 03 Applications of Ionizing Radiations
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50   Application of Ionizing Radiations | Progress Report




















               Figure 6. MCz and Epitaxial silicon diodes on a ceramic base and the PMMA probes.



               small megavoltage fields (Fig 7).              directly coupled with a digital electrometer
                                                              in a short circuit mode to record real-time
               Radiation Processing: The rising demand for    currents and, consequently, dose rates. The
               applications in the field of radiation process-  dose delivered to the product can be obtained
               ing with very high doses has pushed research-  offline via integration of the current signals as
               es to develop dosimetry systems to withstand   a function of the exposure time. As expected,
               harsh radiation environment. In this context,   it was observed a negligible current sensi-
               to improve quality assurance in electron beam   tivity decay for accumulated doses less than
               processing of many products, active semicon-   1.5 MGy. For higher doses, damage effects
               ductor dosimeters were designed based on       on electrical properties of the diodes rose up
               radiation-hard diodes processed on n-type      the dark currents with the accumulated dos-
               Magnetic Czochralski (MCz) silicon substrate.   es and the sensitivity decay reached almost
               The main application envisaged was to mon-     10%. As a consequence, the correspondent
               itor 1.5 MeV electron beam processing cover-   dose-response curves were not linear being
               ing the dose range from 10 kGy to 2 MGy and    fitted by a second order polynomial function.
               dose rates up to 8 kGy/s. During the electron   So far, the results evidenced that MCz diodes
               irradiation, the diodes were unbiased and      are substantially tolerant to radiation damage
                                                                                   assuring their potential
                                                                                   use for high-dose pro-
                                                                                   cessing dosimetry. It still
                                                                                   remains to be dwindled
                                                                                   the damage produced
                                                                                   on  both  the  entrance
                                                                                   window and the walls
                                                                                   of the dosimetric probe.
                                                                                   Researches on this mat-
                                                                                   ter are under way.











               Figure 7.Miniature FZ diode in a waterproof protection and its connection to a coaxial cable.





                         Instituto de Pesquisas Energéticas e Nucleares
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