Page 11 - january
P. 11

PRODUCTION AUTOMATION

    defects are most often absent. At the same stage, the features of the influence of the operating
    modes  of  the  machine  and  changes  in  external  conditions,  such  as  temperature,  quality  of
    electric power, etc., on the diagnostic parameters are identified and taken into account. This
    reduces the likelihood of false triggering of the monitoring system when changing modes or
    external conditions.
            Most  of  the  adaptive  control  and  monitoring  systems  existing  on  the  market  react  to
    changes  in  cutting  conditions  based  on  electromagnetic  signals  from  the  power  unit  of  the
    electric  drive  and  automatically  adjust  the  feed  to  the  maximum  allowable  level  for  each
    operation [17]. If necessary, these systems stop the machine due to overload or when a tool
    break is detected. Often, leading manufacturers of CNC systems, such as Siemens, Heidenhain,
    Fanuc, etc., enter into partnerships with manufacturers of adaptive control systems and carry
    out their full integration with each other. Thus, in the process of management, these systems
    take into account numerous factors affecting the cutting process: cutting parameters, actual
    tool load, level of allowable tool wear, material characteristics, etc., which makes it possible
    to significantly reduce machining time, prevent or determine the moment of tool breakage,
    and minimize equipment downtime. Such systems combine the collection of information from
    sensors, calculation and finding the optimal processing parameters.
            However,  these  systems  also  have  a  number  of  features  that  limit  their  use  only  to
    certain operations and processing modes. The measurement result is influenced by the energy
    characteristics of other drives included in the general power network, a relatively large time
    constant caused by the inertia of the electromechanical system, insufficient sensitivity when
    operating in finishing and semi-finishing modes. These and other disadvantages can be leveled
    by  introducing  an  additional  measuring  channel  using  VA  signals  generated  by  the  cutting
    process or by the operation of the most important units, for example, a spindle [15]. VA signals
                                            are  more  sensitive  to  the  dynamics  of  the  cutting  process,
                                             which is especially important for finishing operations or when
                                                 working with a small tool [18].
                                                          Figure 1 shows a functional diagram of a model,
                                                        which includes a three-axis milling machine with a
                                                        motor-spindle and an information-measuring system
                                                       (IMS)  based  on  monitoring  the  active  power  and
                                                     parameters of VA signals.
                                                   In the acquisition and processing device (USO), the ADC,
                                               DAC and MC units are combined in one 32-bit STM32F417ZGT6
                                            microcontroller with a Cortex-M4F core, a feature of which is
                                            a  floating-point  arithmetic  unit  (FPU),  which  allows  solving
                                            signal-processing tasks simultaneously with its digitization and
                                            management. Responsible for digitizing are three 12-bit ADCs
                                            with performance up to 2.4 MSPS (Mega Sample Per Second,
                                            sampling rate). The control signal is formed by the built-in 12-
                                            bit DAC. The main technical characteristics of the developed
                                            IMS are shown in Table 1.
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