Page 79 - ASME InterPACK 2017 Program
P. 79

Authors Index

LAST NAME   FIRST NAME   SESSION  PAPER TITLE                                                                         PAPER NUMBER
Elzouka     Mahmoud      6-1-1                                                                                        IPACK2017-74429
Enright     Ryan         2-1-4    Meshed Photonic Crystals for Manipulating Near-Field Thermal Radiation Across       IPACK2017-74184
Enright     Ryan         2-1-4    Variable Nano/Micro Gap                                                             IPACK2017-74181
Enright     Ryan         6-2-1    Thermo-Mechanical Study of AlN Thin Films as Heat Spreaders in III-V Photonic       IPACK2017-74217
Erdem       E. Yegan     3-2-1    Devices                                                                             IPACK2017-74178
Fahim       Abdullah     1-5-1    Thermo-optic Tuning Efficiency of Micro Ring Resonators on Low Thermal              IPACK2017-74270
Fahim       Abdullah     6-1-1    Resistance Silicon Photonics Substrates                                             IPACK2017-74237
Faili       Firooz       4-1-3    Integrated Micro-Thermoelectric Cooling for Silicon Photonics: Modeling and         IPACK2017-74163
Faili       Firooz       6-1-1    Fabrication by Template-Assisted Electrochemical Deposition                         IPACK2017-74167
Farokhnia   Nazanin      4-1-5    Silica Nanoparticle Formation by Using Droplet-Based Microreactor                   IPACK2017-74139
Fernandes   John Edward  2-1-3                                                                                        IPACK2017-74288
Fernandes   John Edward  6-1-1    Measurement of Elevated Temperature Mechanical Properties of Intermetallic          IPACK2017-74434
Fiorentino  Marco        2-1-4    Compounds in SAC Solder Joints                                                      IPACK2017-74337
Foong       Chee S       1-6-1    Characterization of IMCs in Sn-Ag-Cu Solder Joints using Nanoindentation            IPACK2017-74173
FORBUS      JEFF         1-3-2                                                                                        IPACK2017-74265
FORBUS      JEFF         6-1-1    Investigation of the Heterogeneous Thermal Conductivity Bulk CVD Diamond for        IPACK2017-74430
Foulkes     Thomas       2-3-2    use in Electronics Thermal Management                                               IPACK2017-74154
Freitag     Karl         1-7-3    Investigation of the Heterogeneous Thermal Conductivity in Bulk CVD Diamond         IPACK2017-74080
Fresne      David        1-6-1    for use in Power Electronics                                                        IPACK2017-74222
Fried       Simon        3-4-1    Decoupled Hierarchical Structures for High-Heat Flux Cooling Systems                IPACK2017-74358
Frizzell    Ronan        6-2-1                                                                                        IPACK2017-74217
Fu          Nianjun      1-3-1    Impact of Static Pressure Differential between Supply Air and Return Exhaust on     IPACK2017-74263
Fu          Nianjun      1-2-1    Server Level Performance                                                            IPACK2017-74121
Fu          Nianjun      1-5-1    Impact of Static Pressure Differential Between Supply Air and Return Exhaust on     IPACK2017-74266
Fu          Nianjun      6-1-1    Server Level Performance                                                            IPACK2017-74231
Fu          Nianjun      6-1-1    Concurrent DWDM Silicon Photonic Interconnect Driven by a Quantum Dot Comb          IPACK2017-74241
Fu          Yanbao       4-4-1    Laser                                                                               IPACK2017-74418
Fujisaki    Kazuhiro     1-4-1    Preliminary Results on the Fabrication of Interconnect Structures Using Microscale  IPACK2017-74059
Fujisaki    Kazuhiro     1-4-1    Selective Laser Sintering                                                           IPACK2017-74092
Funaki      Masahiro     1-3-3    Reliability Assessment of Solder Joint Using BGA Package - Megtron 6 Versus FR4     IPACK2017-74099
                                  Printed Circuit Boards
                                  Reliability Assessment of Solder Joint Using BGA Package - Megtron 6 Versus FR4
                                  Printed Circuit Boards
                                  Steerable Jumping-Droplet Phase-Change Electronics Cooling

                                  State of the Art of Electronics Cooling for Radar Antenna Applications

                                  Numerical and Experimental Determination of Temperature Distribution in 3D
                                  Stacked Power Devices
                                  Accelerating development of PCBs by 3D printing circuits.

                                  Integrated Micro-Thermoelectric Cooling for Silicon Photonics: Modeling and
                                  Fabrication by Template-Assisted Electrochemical Deposition
                                  Effects of Fatigue Cycling on the Microstructure of SAC305 Lead Free Solder

                                  Effects of Aging on the Microstructural Evolution of Lead Free SACN05 and
                                  Doped SAC Alloys
                                  Investigation of Aging Induced Evolution of the Microstructure of SAC305 Lead
                                  Free Solder
                                  The Effects of Aging on the Cyclic Stress-Strain Behavior and Hysteresis Loop
                                  Evolution of SAC+X Solder Materials
                                  Quantitative Analysis of Aging Induced Evolution of IMCs in SAC305 Lead Free
                                  Solder
                                  In-Situ Thermal Characterization of Lithium-Ion Batteries

                                  Analysis for Evaluation of Threshold Current Density of Electromigration Damage
                                  in Taper-shaped Metal Line
                                  Relationship between threshold current density of electromigration damage
                                  considering void and hillock formation and reservoir shape in interconnect line
                                  Stress-based Design Standard for 3216 type of Multilayer Ceramic Capacitor

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