Page 96 - ASME InterPACK 2017 Program
P. 96

Authors Index

LAST NAME    FIRST NAME    SESSION  PAPER TITLE                                                                        PAPER NUMBER
Pathak       Manan         4-4-2                                                                                       IPACK2017-74078
Patterson    Michael       7-2-1    Minimizing Capacity Fade through Optimal Model-based Control - Theory and          IPACK2017-74354
                                    Experimental Validation
                                    A Systems Perspective: Making Thermal Management a 1st Class Citizen

Pavlidis     Georges       4-1-3    Impact of Buffer Layers on the Reliability of GaN on Si HEMTs for Power            IPACK2017-74152
Pavlidis     Georges       5-4-1    Electronics                                                                        IPACK2017-74149

                                    Steady State and Transient Thermal Characterization of Vertical GaN PIN Diodes

Pavlidis     Georges       6-1-1    Steady State and Transient Thermal Characterization of Vertical GaN PIN Diodes     IPACK2017-74151

Peddle       Thomas M.     2-2-2    Comparison and Evaluation of Different Monitoring Methods in a Data Center Envi-   IPACK2017-74105
Pei          Min           1-3-1    ronment                                                                            IPACK2017-74082
Pei          Min           2-2-2                                                                                       IPACK2017-74081
Pei          Min           5-5-2    Knowledge Based Qualification Methodology to Evaluate Shock Induced Risks in       IPACK2017-74194
Philofsky    Brian         1-1-1    BGA Components                                                                     IPACK2017-74262
Pierron      Olivier       3-2-1                                                                                       IPACK2017-74146
                                    Knowledge Based Requirement Calculation for Server BGAs Temperature Cycling
                                    (TC) Qualification

                                    BGA Temperature Cycling Reliability in Automotive Applications: Knowledge
                                    Based Qualification

                                    Extending the Performance of High Heat Flux 2.5D and 3D Packaging from
                                    Component - System Interaction.

                                    Mechanical Reliability of PECVD SiNx Barrier Films for Flexible Electronics

Pilawa-Pod-  Robert C.N.   2-3-2    Steerable Jumping-Droplet Phase-Change Electronics Cooling                         IPACK2017-74154
gurski       Jeremy        1-5-1    Large Flip Chip Assembly Challenges and Risk Mitigation Process                    IPACK2017-74026

Plunkett

Poonjolai    Erasenthiran  1-1-1    Evaluation and selection of Adhesives for Opto-Electronic Components               IPACK2017-74342
Poshtan      Raaja         2-2-1                                                                                       IPACK2017-74021
Prakash      Emad A.       1-1-1    Mechanical Behavior of Thermal Interface Materials in Electronic Components        IPACK2017-74342
                                    under Dynamic Loading Conditions
             Anna                   Evaluation and selection of Adhesives for Opto-Electronic Components

Prasher      Ravi          4-4-1    In-Situ Thermal Characterization of Lithium-Ion Batteries                          IPACK2017-74418

Prasher      Ravi          4-3-1    A Photonic Near Infrared Radiative Heater                                          IPACK2017-74415

Prasher      Ravi          8-1-1    Manipulating Interfacial Thermal Transport Using Surface Chemistry                 IPACK2017-74389

Prisacaru    Alexandru     3-3-2    Piezoresistive Silicon Stress Sensor as a Tool to Monitor Health of an Electronic  IPACK2017-74058
Puckett      Waylon        4-1-5    System                                                                             IPACK2017-74235

                                    Integrated Substrate - Cold Plate for Compact Power Electronics Modules

Pullins      Clayton       1-7-3    State of the Art of Electronics Cooling for Radar Antenna Applications             IPACK2017-74080

Quintero     Pedro O.      4-4-1    Voiding Effects on the Thermal Response of Metallic Phase Change Materials         IPACK2017-74118
                           6-1-1    Under Pulsed Power Loading                                                         IPACK2017-74419
Quintero     Pedro O.      1-1-1                                                                                       IPACK2017-74262
                           4-4-1    Voiding Effects on the Thermal Response of Metallic Phase Change Materials         IPACK2017-74275
Ra-          Gamal         1-3-2    Under Pulsed Power Loading                                                         IPACK2017-74265
fai-ahmed    Ajay          1-3-2                                                                                       IPACK2017-74278
                           1-3-2    Extending the Performance of High Heat Flux 2.5D and 3D Packaging from             IPACK2017-74279
Raghavan                   6-1-1    Component - System Interaction.                                                    IPACK2017-74425

RAHANG-      UNIQUE                 Embedded Fiber-Optic Sensing for Low-Cost, High Resolution Monitoring in
DALE                                Advanced Batteries and IoT-Connected Systems

RAHANG-      UNIQUE                 Reliability Assessment Of Solder Joint Using BGA Package - Megtron 6 Versus
DALE                                FR4 Printed Circuit Boards

RAHANG-      UNIQUE                 A Computational Approach to Study the Impact of PCB Thickness on QFN
DALE                                Assembly Under Drop Testing with Package Power Supply

RAHANG-      UNIQUE                 Reliability Analysis of Ultra-Low-k Large-Die Package & Wire Bond Chip Package
                                    on Varying Structural Parameter Under Thermal Loading
96 DALE
                                    A Computational Approach to Study the Impact of PCB Thickness on QFN
                                    Assembly Under Drop Testing with Package Power Supply
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